Research graph
References from ICEMS Characterization of NixFe3-xO4 (0.7 ≤ x ≤ 1.7) thin films grown by ion beam sputtering on (0001) Al2O3 substrates. Local targets link to admitted publications; unresolved targets remain external evidence.
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Unresolved reference
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10.1557/proc-341-53
10.1557/proc-341-53 · External reference
10.1021/acsanm.7b00037
10.1021/acsanm.7b00037 · 2018 · External reference
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10.1007/978-1-4899-2289-2_3
10.1007/978-1-4899-2289-2_3 · 1989 · External reference
10.1016/j.apsusc.2018.11.152
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Unresolved reference
External reference
10.1080/14786436808223023
10.1080/14786436808223023 · 1968 · External reference
10.1103/physrevb.63.184108
10.1103/physrevb.63.184108 · 2001 · External reference
10.1088/1742-6596/2046/1/012061
10.1088/1742-6596/2046/1/012061 · External reference
