Research graph
References from Testability measures reduce test generation time in sequential ATPG. Local targets link to admitted publications; unresolved targets remain external evidence.
Unresolved reference
1985 · External reference
Unresolved reference
1990 · External reference
A heuristic algorithm for the testing of asynchronous circuits
10.1109/t-c.1971.223315 · 1971 · External reference
Unresolved reference
1976 · External reference
The sequential ATPG: a theoretical limit
1983 · External reference
Controllability/observability analysis of digital circuits
10.1109/tcs.1979.1084687 · 1979 · External reference
TMEAS—a testability measurement program
1979 · External reference
A testability measure for register transfer level digital circuits
1976 · External reference
Algebraic/topological combined strategies for sequential ATPG
1991 · External reference
Combinational profiles of sequential benchmark circuits
1989 · External reference
