Research graph
References from Reverse engineering the Raspberry Pi Camera V2: A study of pixel non-uniformity using a scanning electron microscope. Local targets link to admitted publications; unresolved targets remain external evidence.
The non-uniform characteristics of a photodiode
2017 · External reference
Unresolved reference
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A review of the pinned photodiode for ccd and cmos image sensors
10.1109/jeds.2014.2306412 · 2014 · External reference
Large scale test of sensor fingerprint camera identification
2009 · External reference
Unresolved reference
1994 · External reference
Unresolved reference
1957 · External reference
Planar micrometrology in the sem
1980 · External reference
Unresolved reference
1980 · External reference
Case studies and further improvements on source camera identification
2013 · External reference
Parameters characterizing the measurement of a critical dimension
1994 · External reference
Digital camera identification from sensor pattern noise
10.1109/tifs.2006.873602 · 2006 · External reference
Exploiting dark current for forensic image identification
2019 · External reference
Isolating lens aberrations within fixed pattern noise
2017 · External reference
Isolating lens aberrations within fixed pattern noise using photo response non-uniformity noise
2018 · External reference
Thermal effects of dark current on blind source camera identification
2018 · External reference
An analysis of optical contributions to a photo-sensor’s ballistic fingerprints
10.1016/j.diin.2019.02.002 · 2019 · External reference
Does your sem really tell the truth?–how would you know? part 1
10.1002/sca.21075 · 2013 · External reference
Influence of pixel design on charge transfer performances in cmos image sensors
10.1109/ted.2018.2790443 · 2018 · External reference
Source camera identification using footprints from lens aberration
10.1117/12.649775 · 2006 · External reference
Fiji: an open-source platform for biological-image analysis
10.1038/nmeth.2019 · 2012 · External reference
Unresolved reference
1857 · External reference
Unresolved reference
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Unresolved reference
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Unresolved reference
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A 130 nm generation logic technology featuring 70 nm transistors, dual vt transistors and 6 layers of cu interconnects
2000 · External reference
