Research graph
References from Effect of complex surface morphologies on secondary electron yield characteristics of polyimide films based on Geant4. Local targets link to admitted publications; unresolved targets remain external evidence.
Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications
10.1049/hve2.70020 · 2025 · External reference
Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods
10.1088/1361-6463/ad5c6f · 2024 · External reference
Dynamic charging behavior of dielectric surfaces induced by electron beam irradiation and its effect on multipacting
2025 · External reference
Numerical investigation of vacuum surface flashover triggered by inverted potential gradient on solar cells using particle-in-cell method
10.1063/5.0288856 · 2025 · External reference
Analysis of charging effect on spacecraft surface under solar wind
2022 · External reference
Database of secondary electron yield and energy spectra for dielectric sam⁃ ples by electron irradiation
2021 · External reference
Detailed Study of the total electron emission yield (TEEY) properties of black kapton under electron impact
2025 · External reference
Vacuum recovery of polyimide films damaged with high energy electron radiation
10.1007/s40295-022-00336-w · 2022 · External reference
Fulfilling the promise of the materials genome initiative with high-throughput experimental methodologies
10.1063/1.4977487 · 2017 · External reference
Secondary electron emission from gold microparticles in a transmission electron microscope: comparison of Monte Carlo simulations with experimental results
10.1088/1361-6463/ad9840 · 2024 · External reference
Modelling the impact of graphene coating of different thicknesses on polyimide substrate on the secondary electron yield
10.3390/coatings14010013 · 2023 · External reference
Impacts of Geant4 hadronic physics models on secondary particle productions in proton therapy simulations
10.1016/j.radphyschem.2024.112451 · 2025 · External reference
Surface modification of space exposed materials induced by low energetic proton irradiation
10.1007/s40295-021-00277-w · 2021 · External reference
10.1016/j.nimb.2022.05.006
10.1016/j.nimb.2022.05.006 · External reference
Experimental erosion analysis and computational modeling of SiO -coated polyimide in atomic oxygen under super-low-Earth-orbit conditions
10.1016/j.ast.2025.110611 · 2025 · External reference
Suppression of secondary electron emission from polyimide materials with parallel and crossed groove structures
10.1016/j.vacuum.2025.114342 · 2025 · External reference
Effect of rectangular grooves and checkerboard patterns on the electron emission yield
10.1063/1.5028216 · 2018 · External reference
Analytical model of the secondary electron yield of metal regular rough surfaces
10.7498/aps.64.207901 · 2015 · External reference
DIRECT DETECTION OF DARK MATTER
10.1146/annurev.nucl.54.070103.181244 · 2004 · External reference
Validation of the Geant4 PIXE component for incident carbon ions
10.1016/j.nimb.2022.10.010 · 2022 · External reference
Allowing for crystalline structure effects in Geant4
10.1016/j.nimb.2017.03.092 · 2017 · External reference
Simulation of Auger electron emission from nanometer-size gold targets using the Geant4 Monte Carlo simulation toolkit
10.1016/j.nimb.2016.02.005 · 2016 · External reference
Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si
10.1063/1.4984761 · 2017 · External reference
Geant4 physics processes for microdosimetry simulation: very low energy electromagnetic models for electrons in silicon
10.1016/j.nimb.2012.07.028 · 2012 · External reference
Geant4 physics processes for microdosimetry and secondary electron emission simulation: extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)
10.1016/j.nimb.2020.11.016 · 2021 · External reference
The study of electron emission from aluminum in the very low primary energy range using Monte Carlo simulations
10.1088/0022-3727/46/12/125306 · 2013 · External reference
Electron inelastic mean free paths in condensed matter down to a few electronvolts
10.1021/acs.jpcc.8b10832 · 2019 · External reference
ELSEPA—Dirac partial-wave calculation of elastic scattering of electrons and positrons by atoms, positive ions and molecules
10.1016/j.cpc.2004.09.006 · 2005 · External reference
Electron inelastic mean free paths for LiF, CaF2, Al2O3, and liquid water from 433 keV down to the energy gap
10.1021/acsomega.9b03872 · 2020 · External reference
Calculation of energy-loss straggling of C, Al, Si, and Cu for fast H, He, and Li ions
10.1103/physreva.75.022903 · 2007 · External reference
Effects of electron incident angle on the secondary electron yield for polyimide
2015 · External reference
Atomic oxygen erosion of a poly(ester-imide) film
10.1016/j.polymdegradstab.2024.111137 · 2025 · External reference
Probabilistic model for the simulation of secondary electron emission
10.1103/physrevstab.5.124404 · 2002 · External reference
Unresolved reference
1954 · External reference
Secondary electron emission in the scanning electron microscope
10.1063/1.332840 · 1983 · External reference
Surface modification of space exposed materials induced by low energetic proton irradiation
10.1007/s40295-021-00277-w · ExternalCitation · doi-reference
Vacuum recovery of polyimide films damaged with high energy electron radiation
10.1007/s40295-022-00336-w · ExternalCitation · doi-reference
Experimental erosion analysis and computational modeling of SiO -coated polyimide in atomic oxygen under super-low-Earth-orbit conditions
10.1016/j.ast.2025.110611 · ExternalCitation · doi-reference
ELSEPA—Dirac partial-wave calculation of elastic scattering of electrons and positrons by atoms, positive ions and molecules
10.1016/j.cpc.2004.09.006 · ExternalCitation · doi-reference
Geant4 physics processes for microdosimetry simulation: very low energy electromagnetic models for electrons in silicon
10.1016/j.nimb.2012.07.028 · ExternalCitation · doi-reference
Simulation of Auger electron emission from nanometer-size gold targets using the Geant4 Monte Carlo simulation toolkit
10.1016/j.nimb.2016.02.005 · ExternalCitation · doi-reference
Allowing for crystalline structure effects in Geant4
10.1016/j.nimb.2017.03.092 · ExternalCitation · doi-reference
Geant4 physics processes for microdosimetry and secondary electron emission simulation: extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)
10.1016/j.nimb.2020.11.016 · ExternalCitation · doi-reference
10.1016/j.nimb.2022.05.006
10.1016/j.nimb.2022.05.006 · ExternalCitation · doi-reference
Validation of the Geant4 PIXE component for incident carbon ions
10.1016/j.nimb.2022.10.010 · ExternalCitation · doi-reference
Atomic oxygen erosion of a poly(ester-imide) film
10.1016/j.polymdegradstab.2024.111137 · ExternalCitation · doi-reference
Impacts of Geant4 hadronic physics models on secondary particle productions in proton therapy simulations
10.1016/j.radphyschem.2024.112451 · ExternalCitation · doi-reference
Suppression of secondary electron emission from polyimide materials with parallel and crossed groove structures
10.1016/j.vacuum.2025.114342 · ExternalCitation · doi-reference
Electron inelastic mean free paths in condensed matter down to a few electronvolts
10.1021/acs.jpcc.8b10832 · ExternalCitation · doi-reference
Electron inelastic mean free paths for LiF, CaF2, Al2O3, and liquid water from 433 keV down to the energy gap
10.1021/acsomega.9b03872 · ExternalCitation · doi-reference
Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications
10.1049/hve2.70020 · ExternalCitation · doi-reference
Secondary electron emission in the scanning electron microscope
10.1063/1.332840 · ExternalCitation · doi-reference
Fulfilling the promise of the materials genome initiative with high-throughput experimental methodologies
10.1063/1.4977487 · ExternalCitation · doi-reference
Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si
10.1063/1.4984761 · ExternalCitation · doi-reference
Effect of rectangular grooves and checkerboard patterns on the electron emission yield
10.1063/1.5028216 · ExternalCitation · doi-reference
Numerical investigation of vacuum surface flashover triggered by inverted potential gradient on solar cells using particle-in-cell method
10.1063/5.0288856 · ExternalCitation · doi-reference
The study of electron emission from aluminum in the very low primary energy range using Monte Carlo simulations
10.1088/0022-3727/46/12/125306 · ExternalCitation · doi-reference
Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods
10.1088/1361-6463/ad5c6f · ExternalCitation · doi-reference
Secondary electron emission from gold microparticles in a transmission electron microscope: comparison of Monte Carlo simulations with experimental results
10.1088/1361-6463/ad9840 · ExternalCitation · doi-reference
Calculation of energy-loss straggling of C, Al, Si, and Cu for fast H, He, and Li ions
10.1103/physreva.75.022903 · ExternalCitation · doi-reference
Probabilistic model for the simulation of secondary electron emission
10.1103/physrevstab.5.124404 · ExternalCitation · doi-reference
DIRECT DETECTION OF DARK MATTER
10.1146/annurev.nucl.54.070103.181244 · ExternalCitation · doi-reference
Modelling the impact of graphene coating of different thicknesses on polyimide substrate on the secondary electron yield
10.3390/coatings14010013 · ExternalCitation · doi-reference
Analytical model of the secondary electron yield of metal regular rough surfaces
10.7498/aps.64.207901 · ExternalCitation · doi-reference
