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References from A universal method for thermal conductivity measurements on micro-/nano-films with and without substrates using micro-Raman spectroscopy. Local targets link to admitted publications; unresolved targets remain external evidence.
Temperature-depending Raman line-shift of silicon carbide
10.1002/jrs.2334 · 2009 · External reference
The morphology of silicon nanowire samples: a Raman study
10.1002/pssb.200982341 · 2009 · External reference
Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions
10.1016/j.microrel.2014.12.007 · 2015 · External reference
Raman temperature measurement
2014 · External reference
Micro-Raman thermometry of thermal flexure actuators
10.1088/0960-1317/16/7/004 · 2006 · External reference
Parallel measurement of conductive and convective thermal transport of micro/nanowires based on Raman mapping
10.1063/1.4923189 · 2015 · External reference
Study of Thermal Conductivity of Porous Silicon Using the Micro-Raman Method
10.4236/ojpc.2012.21001 · 2012 · External reference
Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry
10.1063/1.4861796 · 2014 · External reference
Thermal conductivity measurements of suspended graphene with and without wrinkles by micro-Raman mapping
10.1088/0957-4484/23/36/365701 · 2012 · External reference
Measurement of porous silicon thermal conductivity by micro-Raman scattering
10.1063/1.371424 · 1999 · External reference
Thermal conductivity measurement of submicrometer-scale silicon dioxide films by an extended micro-Raman method
10.1007/s00542-009-0824-3 · 2009 · External reference
The effect of a surface coating on the constriction resistance of a spot on an infinite half-plane
10.1115/1.3245596 · 1983 · External reference
The effect of coatings on the steady-state and short time constriction resistance for an arbitrary axisymmetric flux
10.1115/1.3247398 · 1985 · External reference
Raman measurements of thermal transport in suspended monolayer graphene of variable sizes in vacuum and gaseous environments
10.1021/nn102915x · 2011 · External reference
Measurement of in-plane thermal conductivity of ultrathin films using micro-raman spectroscopy
10.1080/15567265.2014.892553 · 2014 · External reference
A novel contactless technique for thermal field mapping and thermal conductivity determination: Two-Laser Raman Thermometry
10.1063/1.4867166 · 2014 · External reference
Measuring the thermal conductivity of thin films: 3 omega and related electrothermal methods
2013 · External reference
Analysis of the 3-omega method for thermal conductivity measurement
10.1016/j.ijheatmasstransfer.2008.10.020 · 2009 · External reference
Photoacoustic technique for thermal conductivity and thermal interface measurements
2013 · External reference
A photoacoustic study of thermal conductivity annealing curves for a silicon substrate implanted with Si ions
10.1002/ecjb.10034 · 2003 · External reference
Amorphization of ion implanted layers in silicon using photoacoustic detection
10.1063/1.104619 · 1991 · External reference
Unresolved reference
1959 · External reference
Unresolved reference
1986 · External reference
Unresolved reference
1996 · External reference
Constriction resistance of circular contacts on coated surfaces – effect of boundary conditions
10.2514/3.80 · 1988 · External reference
Constriction resistance of a plated solid
10.1016/j.ijheatmasstransfer.2015.03.032 · 2015 · External reference
Microcrystalline silicon n-i-p solar cells prepared with microcrystalline silicon oxide (μc-SiOx:H) n-layer
10.1002/pssc.200982830 · 2010 · External reference
Scanning probe microscopy of thermal conductivity and subsurface properties
10.1063/1.108207 · 1992 · External reference
Role of four-phonon processes in the lattice thermal conductivity of silicon from 300 to 1300°K
10.1103/physrevb.1.642 · 1970 · External reference
Raman scattering from crystals of the diamond structure
10.1051/jphys:019650026011065900 · 1965 · External reference
Temperature dependence of raman scattering in silicon
10.1103/physrevb.1.638 · 1970 · External reference