Research graph
References from Effect of substrate modulus difference on dislocation formation in an epitaxial film. Local targets link to admitted publications; unresolved targets remain external evidence.
Unresolved reference
External reference
Screw dislocations in and near lamellar inclusions
10.1002/pssb.19660170206 · 1966 · External reference
10.1520/stp34243s
10.1520/stp34243s · External reference
One dimensional dislocations: I. Static theory
10.1098/rspa.1949.0095 · 1949 · External reference
The driving force for glide of a threading dislocation in a strained epitaxial layer on a substrate
10.1016/0022-5096(90)90027-2 · 1990 · External reference
The mechanics of dislocations in strained-layer semiconductor materials
10.1016/s0065-2156(08)70173-x · 1993 · External reference
A critical thickness condition for a strained complaint substrate/epitaxial film system
10.1063/1.117362 · 1996 · External reference
The energy of an array of dislocations in an anisotropic half-space
10.1080/01418619408242211 · 1994 · External reference
Screw dislocations in a thin-phase heteroepitaxial plate
10.1002/pssa.2211290109 · 1992 · External reference
Defects in epitaxial multilayers
1974 · External reference
Steady state cracking in brittle substrates beneath adherent films
10.1016/0020-7683(89)90096-6 · 1989 · External reference
Interface crack between two elastic layers
10.1007/bf00018123 · 1990 · External reference
The energy of an array of dislocations: implications for strain relaxation in semiconductor heterostructures
10.1080/01418619008244339 · 1990 · External reference
The energy of an array of dislocations: II. Consideration of a capped epitaxial layer
10.1080/01418619108204865 · 1991 · External reference
Effect of elastic constants on the critical thickness of an epilayer
10.1002/pssa.2211520210 · 1995 · External reference
Isotropic and anisotropic elasticity studies of mismatch dislocations, critical thickness and work hardening in epilayers
10.4028/www.scientific.net/ddf.136-137.61 · 1996 · External reference
Criteria for formation of interface dislocations in a finite thickness epilayer deposited on a substrate
10.1063/1.370558 · 1999 · External reference
