Research graph
References from On-wafer 16-term calibration approach for dual-setup, bias-dependent RF characterization of scaled InP HBTs. Local targets link to admitted publications; unresolved targets remain external evidence.
10.1109/mwsym.2007.380537
10.1109/mwsym.2007.380537 · External reference
10.23919/eumic58042.2023.10288849
10.23919/eumic58042.2023.10288849 · External reference
A general 4-port solution for 110 GHz On-wafer transistor measurements with or without Impedance Standard Substrate (ISS) calibration
10.1109/ted.2007.904362 · 2007 · External reference
10.1109/led.2025.3558540
10.1109/led.2025.3558540 · External reference
10.23919/eumc61614.2024.10732142
10.23919/eumc61614.2024.10732142 · External reference
10.1049/el:19931029
10.1049/el:19931029 · External reference
10.1109/22.899967
10.1109/22.899967 · External reference
10.1109/75.84601
10.1109/75.84601 · External reference
10.1109/jproc.2017.2692178
10.1109/jproc.2017.2692178 · External reference
10.1109/iciprm.2007.381209
10.1109/iciprm.2007.381209 · External reference
10.1109/jmw.2024.3413865
10.1109/jmw.2024.3413865 · External reference
10.1109/22.106567
10.1109/22.106567 · External reference
10.23919/eumc65286.2025.11235132
10.23919/eumc65286.2025.11235132 · External reference
10.1109/22.137392
10.1109/22.137392 · External reference
Unresolved reference
2006 · External reference
10.1109/16.960387
10.1109/16.960387 · External reference
10.1109/ted.2021.3118671
10.1109/ted.2021.3118671 · External reference
10.1109/iedm.2016.7838506
10.1109/iedm.2016.7838506 · External reference
10.1109/ted.2015.2455231
10.1109/ted.2015.2455231 · External reference
10.1109/tmtt.2025.3550095
10.1109/tmtt.2025.3550095 · External reference
10.1109/mmm.2024.3428191
10.1109/mmm.2024.3428191 · External reference
10.1109/mmm.2021.3117139
10.1109/mmm.2021.3117139 · External reference
10.1049/el:19931029
10.1049/el:19931029 · ExternalCitation · doi-reference
10.1109/16.960387
10.1109/16.960387 · ExternalCitation · doi-reference
10.1109/22.106567
10.1109/22.106567 · ExternalCitation · doi-reference
10.1109/22.137392
10.1109/22.137392 · ExternalCitation · doi-reference
10.1109/22.899967
10.1109/22.899967 · ExternalCitation · doi-reference
10.1109/75.84601
10.1109/75.84601 · ExternalCitation · doi-reference
10.1109/iciprm.2007.381209
10.1109/iciprm.2007.381209 · ExternalCitation · doi-reference
10.1109/iedm.2016.7838506
10.1109/iedm.2016.7838506 · ExternalCitation · doi-reference
10.1109/jmw.2024.3413865
10.1109/jmw.2024.3413865 · ExternalCitation · doi-reference
10.1109/jproc.2017.2692178
10.1109/jproc.2017.2692178 · ExternalCitation · doi-reference
10.1109/led.2025.3558540
10.1109/led.2025.3558540 · ExternalCitation · doi-reference
10.1109/mmm.2021.3117139
10.1109/mmm.2021.3117139 · ExternalCitation · doi-reference
10.1109/mmm.2024.3428191
10.1109/mmm.2024.3428191 · ExternalCitation · doi-reference
10.1109/mwsym.2007.380537
10.1109/mwsym.2007.380537 · ExternalCitation · doi-reference
A general 4-port solution for 110 GHz On-wafer transistor measurements with or without Impedance Standard Substrate (ISS) calibration
10.1109/ted.2007.904362 · ExternalCitation · doi-reference
10.1109/ted.2015.2455231
10.1109/ted.2015.2455231 · ExternalCitation · doi-reference
10.1109/ted.2021.3118671
10.1109/ted.2021.3118671 · ExternalCitation · doi-reference
10.1109/tmtt.2025.3550095
10.1109/tmtt.2025.3550095 · ExternalCitation · doi-reference
10.23919/eumc61614.2024.10732142
10.23919/eumc61614.2024.10732142 · ExternalCitation · doi-reference
10.23919/eumc65286.2025.11235132
10.23919/eumc65286.2025.11235132 · ExternalCitation · doi-reference
10.23919/eumic58042.2023.10288849
10.23919/eumic58042.2023.10288849 · ExternalCitation · doi-reference
