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References from Calculation of Direct Tunneling Current through Ultra-Thin Gate Oxides Using Complex Band Models For SiO2. Local targets link to admitted publications; unresolved targets remain external evidence.
10.1103/physrevb.54.7670
10.1103/physrevb.54.7670 · 1996 · External reference
10.1063/1.1290159
10.1063/1.1290159 · 2000 · External reference
Unresolved reference
External reference
10.1109/16.870550
10.1109/16.870550 · 2000 · External reference
10.1063/1.360993
10.1063/1.360993 · 1996 · External reference
10.1016/s0080-8784(08)62376-5
10.1016/s0080-8784(08)62376-5 · 1966 · External reference
10.1116/1.577474
10.1116/1.577474 · 1991 · External reference
10.1109/16.930653
10.1109/16.930653 · 2001 · External reference
10.1063/1.117072
10.1063/1.117072 · 1996 · External reference
10.1103/physrevb.27.2346
10.1103/physrevb.27.2346 · 1983 · External reference
10.1063/1.1330764
10.1063/1.1330764 · 2001 · External reference
10.1109/16.772489
10.1109/16.772489 · 1999 · External reference
10.1103/physrevb.45.3583
10.1103/physrevb.45.3583 · 1992 · External reference
10.1063/1.1654509
10.1063/1.1654509 · 1974 · External reference
10.1016/0022-3697(83)90064-1
10.1016/0022-3697(83)90064-1 · 1983 · External reference
