Research graph
References from Simulation of Transport and Noise Properties of SILCs Through Thin-Oxide MOS Structures. Local targets link to admitted publications; unresolved targets remain external evidence.
10.1016/s0167-9317(01)00639-6
10.1016/s0167-9317(01)00639-6 · 2001 · External reference
10.1109/relphy.1996.492070
10.1109/relphy.1996.492070 · External reference
Unresolved reference
External reference
10.1063/1.1321735
10.1063/1.1321735 · 2000 · External reference
10.1103/physrevb.55.4539
10.1103/physrevb.55.4539 · 1997 · External reference
10.1063/1.329919
10.1063/1.329919 · 1982 · External reference
10.1109/iedm.1992.307327
10.1109/iedm.1992.307327 · External reference
10.1109/16.8801
10.1109/16.8801 · 1988 · External reference
10.1109/16.701488
10.1109/16.701488 · 1998 · External reference
Unresolved reference
External reference
10.1109/16.740899
10.1109/16.740899 · External reference
