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References from Accurate I–V characterization of MOS/MS devices via Ocaya–Yakuphanoglu method. Local targets link to admitted publications; unresolved targets remain external evidence.
Influence of DNA solution on dark and deep-UV response of Ga2O3/p-Si Schottky diodes
10.1109/lpt.2026.3693070 · 2026 · External reference
Abnormal performance of the Schottky barrier diodes extraction methods under bias dependent series resistance
10.1088/1402-4896/ae20d1 · 2025 · External reference
Extraction of Schottky diode parameters from forward current-voltage characteristics
10.1063/1.97359 · 1986 · External reference
A modified forward I-V plot for Schottky diodes with high series resistance
10.1063/1.325607 · 1979 · External reference
New method to extract the model parameters of solar cells from the explicit analytic solutions of their illuminated I-V characteristics
10.1016/j.solmat.2005.04.023 · 2006 · External reference
10.1016/j.spmi.2021.106958
10.1016/j.spmi.2021.106958 · 2021 · External reference
LambertW function to extract physical parameters of a Schottky barrier diode from its I–V characteristics
10.3390/en15051667 · 2022 · External reference
Advances in Schottky parameter extraction and applications
10.1016/j.jmst.2024.08.037 · 2025 · External reference
An alternative approach to extract diode parameters from metal-semiconductor-metal asymmetric Schottky diodes
10.1088/1361-6463/ac85ff · 2022 · External reference
Ocaya–Yakuphanoğlu method for series resistance extraction and compensation of Schottky diode I–V characteristics
10.1016/j.measurement.2021.110105 · 2021 · External reference
Gaussian thermionic emission model for analysis of Au/MoS2 Schottky-barrier devices
10.1103/physrevapplied.14.054027 · 2020 · External reference
MOS capacitors I
2009 · External reference
Trench MOS Schottky diodes: A physics-based analytical model approach to charge sharing
10.3390/mi16010090 · 2025 · External reference
Unresolved reference
2021 · External reference
Unresolved reference
External reference