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References from SURFACE ROUGHNESS OF SPUTTERED SILICON. II. MODEL VERIFICATION. Local targets link to admitted publications; unresolved targets remain external evidence.
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10.1117/12.396444
10.1117/12.396444 · External reference
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10.1116/1.590959
10.1116/1.590959 · 1999 · External reference
10.1063/1.117668
10.1063/1.117668 · 1996 · External reference
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10.1007/3540105212_7
10.1007/3540105212_7 · External reference
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