Research graph
References from Shaping cryogenic 3D volume imaging by pFIB ion species and milling voltage. Local targets link to admitted publications; unresolved targets remain external evidence.
10.1146/annurev-biophys-111622-091327
10.1146/annurev-biophys-111622-091327 · External reference
10.1016/j.sbi.2025.103138
10.1016/j.sbi.2025.103138 · External reference
10.1016/j.molcel.2025.11.029
10.1016/j.molcel.2025.11.029 · External reference
10.1016/j.jsb.2013.09.024
10.1016/j.jsb.2013.09.024 · External reference
10.1016/j.cell.2024.01.005
10.1016/j.cell.2024.01.005 · External reference
10.7554/elife.25916
10.7554/elife.25916 · External reference
10.1007/978-1-0716-0691-9_12
10.1007/978-1-0716-0691-9_12 · External reference
10.1016/j.jsb.2016.09.016
10.1016/j.jsb.2016.09.016 · External reference
10.7554/elife.83623
10.7554/elife.83623 · External reference
10.1007/b101190
10.1007/b101190 · External reference
10.1557/mrs2007.63
10.1557/mrs2007.63 · External reference
10.1073/pnas.2301852120
10.1073/pnas.2301852120 · External reference
10.1016/j.str.2023.07.002
10.1016/j.str.2023.07.002 · External reference
Total and Differential Sputtering Yields Explored by SRIM Simulations
10.3390/coatings12101541 · 2022 · External reference
10.1038/s41467-023-36372-9
10.1038/s41467-023-36372-9 · External reference
10.1016/j.ultramic.2024.113980
10.1016/j.ultramic.2024.113980 · External reference
10.1107/s2052252523001902
10.1107/s2052252523001902 · External reference
10.1007/978-3-540-38967-5
10.1007/978-3-540-38967-5 · External reference
10.64898/2026.06.21.733621
10.64898/2026.06.21.733621 · External reference
Unresolved reference
External reference
Unresolved reference
External reference
10.1038/s41598-021-92608-y
10.1038/s41598-021-92608-y · External reference
Charging in scanning electron microscopy “from inside and outside”
10.1002/sca.4950260406 · 2004 · External reference
Reduction of SEM charging artefacts in native cryogenic biological samples
10.1038/s41467-025-60545-3 · 2025 · External reference
Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model
10.1017/s1431927618015234 · 2018 · External reference
10.7554/elife.45919
10.7554/elife.45919 · External reference
10.1101/2025.09.25.678572
10.1101/2025.09.25.678572 · External reference
Stripe and ring artifact removal with combined wavelet — Fourier filtering
10.1364/oe.17.008567 · 2009 · External reference
10.1111/jmi.13254
10.1111/jmi.13254 · External reference
10.5281/zenodo.21879285
10.5281/zenodo.21879285 · External reference
10.1038/s41592-019-0582-9
10.1038/s41592-019-0582-9 · External reference
Unresolved reference
External reference
10.1007/bf00127822
10.1007/bf00127822 · External reference
10.1016/j.patcog.2012.11.011
10.1016/j.patcog.2012.11.011 · External reference
Contrast in complex images
10.1364/josaa.7.002032 · 1990 · External reference
10.1038/s41467-019-11024-z
10.1038/s41467-019-11024-z · External reference
10.1016/j.jsb.2005.05.009
10.1016/j.jsb.2005.05.009 · External reference
10.1016/j.jmb.2003.07.013
10.1016/j.jmb.2003.07.013 · External reference
10.25080/majora-92bf1922-011
10.25080/majora-92bf1922-011 · External reference
10.1007/978-3-319-24574-4_28
10.1007/978-3-319-24574-4_28 · External reference
10.48550/arxiv.1212.5701
10.48550/arxiv.1212.5701 · External reference
SRIM – The stopping and range of ions in matter (2010)
10.1016/j.nimb.2010.02.091 · 2010 · External reference
Charging in scanning electron microscopy “from inside and outside”
10.1002/sca.4950260406 · ExternalCitation · doi-reference
10.1007/978-1-0716-0691-9_12
10.1007/978-1-0716-0691-9_12 · ExternalCitation · doi-reference
10.1007/978-3-319-24574-4_28
10.1007/978-3-319-24574-4_28 · ExternalCitation · doi-reference
10.1007/978-3-540-38967-5
10.1007/978-3-540-38967-5 · ExternalCitation · doi-reference
10.1007/b101190
10.1007/b101190 · ExternalCitation · doi-reference
10.1007/bf00127822
10.1007/bf00127822 · ExternalCitation · doi-reference
10.1016/j.cell.2024.01.005
10.1016/j.cell.2024.01.005 · ExternalCitation · doi-reference
10.1016/j.jmb.2003.07.013
10.1016/j.jmb.2003.07.013 · ExternalCitation · doi-reference
10.1016/j.jsb.2005.05.009
10.1016/j.jsb.2005.05.009 · ExternalCitation · doi-reference
10.1016/j.jsb.2013.09.024
10.1016/j.jsb.2013.09.024 · ExternalCitation · doi-reference
10.1016/j.jsb.2016.09.016
10.1016/j.jsb.2016.09.016 · ExternalCitation · doi-reference
10.1016/j.molcel.2025.11.029
10.1016/j.molcel.2025.11.029 · ExternalCitation · doi-reference
SRIM – The stopping and range of ions in matter (2010)
10.1016/j.nimb.2010.02.091 · ExternalCitation · doi-reference
10.1016/j.patcog.2012.11.011
10.1016/j.patcog.2012.11.011 · ExternalCitation · doi-reference
10.1016/j.sbi.2025.103138
10.1016/j.sbi.2025.103138 · ExternalCitation · doi-reference
10.1016/j.str.2023.07.002
10.1016/j.str.2023.07.002 · ExternalCitation · doi-reference
10.1016/j.ultramic.2024.113980
10.1016/j.ultramic.2024.113980 · ExternalCitation · doi-reference
Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model
10.1017/s1431927618015234 · ExternalCitation · doi-reference
10.1038/s41467-019-11024-z
10.1038/s41467-019-11024-z · ExternalCitation · doi-reference
10.1038/s41467-023-36372-9
10.1038/s41467-023-36372-9 · ExternalCitation · doi-reference
Reduction of SEM charging artefacts in native cryogenic biological samples
10.1038/s41467-025-60545-3 · ExternalCitation · doi-reference
10.1038/s41592-019-0582-9
10.1038/s41592-019-0582-9 · ExternalCitation · doi-reference
10.1038/s41598-021-92608-y
10.1038/s41598-021-92608-y · ExternalCitation · doi-reference
10.1073/pnas.2301852120
10.1073/pnas.2301852120 · ExternalCitation · doi-reference
10.1101/2025.09.25.678572
10.1101/2025.09.25.678572 · ExternalCitation · doi-reference
10.1107/s2052252523001902
10.1107/s2052252523001902 · ExternalCitation · doi-reference
10.1111/jmi.13254
10.1111/jmi.13254 · ExternalCitation · doi-reference
10.1146/annurev-biophys-111622-091327
10.1146/annurev-biophys-111622-091327 · ExternalCitation · doi-reference
Contrast in complex images
10.1364/josaa.7.002032 · ExternalCitation · doi-reference
Stripe and ring artifact removal with combined wavelet — Fourier filtering
10.1364/oe.17.008567 · ExternalCitation · doi-reference
10.1557/mrs2007.63
10.1557/mrs2007.63 · ExternalCitation · doi-reference
10.25080/majora-92bf1922-011
10.25080/majora-92bf1922-011 · ExternalCitation · doi-reference
Total and Differential Sputtering Yields Explored by SRIM Simulations
10.3390/coatings12101541 · ExternalCitation · doi-reference
10.48550/arxiv.1212.5701
10.48550/arxiv.1212.5701 · ExternalCitation · doi-reference
10.5281/zenodo.21879285
10.5281/zenodo.21879285 · ExternalCitation · doi-reference
10.64898/2026.06.21.733621
10.64898/2026.06.21.733621 · ExternalCitation · doi-reference
10.7554/elife.25916
10.7554/elife.25916 · ExternalCitation · doi-reference
10.7554/elife.45919
10.7554/elife.45919 · ExternalCitation · doi-reference
10.7554/elife.83623
10.7554/elife.83623 · ExternalCitation · doi-reference
