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Abstract
Abstract
Gadolinium oxide nanorod (Gd
2
O
3
NR) was fabricated on an n-type silicon substrate by catalyst-free glancing angle deposition (GLAD) technique. The as-grown sample was annealed at 500 °C to investigate the impact of annealing on structure and optical properties. XRD analysis reveals an improvement in the crystal structure after annealing. Field emission scanning electron microscope (FE-SEM) and energy dispersive X-ray (EDX) confirm the successful growth of vertically aligned Gd
2
O
3
NR with the presence of Gd, O, and Si. Transmission electron microscope (TEM) showed the crystalline nature of the grown Gd
2
O
3
NR. Finally, UV–vis spectroscopy was performed to study the optical properties. A significant enhancement in the photon absorption (200–300 nm) was observed, which can be attributed to increased grain size, improved crystallinity, and large generation of electron–hole pairs. In addition, the Tauc plot showed a decrease in the bandgap from 5.05 eV to 4.98 eV after annealing at 500 °C.
