Abstract
Ziwei Wei, Yao Shen, Wanheng Lu, Kaiyang Zeng
Abstract
Authors
Institutions
Provenance
crossref
Confidence 100%
No local reference links have been materialized yet.
No local citing links have been materialized yet.
A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences
10.1016/j.mechatronics.2004.04.005 · 2004
Imaging modes of atomic force microscopy for application in molecular and cell biology
10.1038/nnano.2017.45 · 2017
Probing of local multifield coupling phenomena of advanced materials by scanning probe microscopy techniques
10.1002/adma.201803064 · 2018
Recent advances in the application of scanning probe microscopy in interfacial electroanalytical chemistry
10.1016/j.jelechem.2023.117443 · 2023
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AFM imaging artifacts due to bacterial cell height and AFM TIP Geometry
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Tip artifacts in atomic force microscope imaging of thin film surfaces
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Large-area high-speed scanning probe microscopy using legacy scanners
10.1063/1.5092704 · 2019
Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints
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openalex
Confidence 95%
datacite
Confidence 0%
10.1002/smll.202503921
10.1002/smll.202503921
Machine learning-driven automated scanning probe microscopy for ferroelectrics
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End-to-end differentiable blind tip reconstruction for noisy atomic force microscopy images
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Data-efficient segmentation of scanning probe microscopy images via an enhanced large vision model for materials characterization
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10.52202/075280-0700 · doi-reference
Data-efficient segmentation of scanning probe microscopy images via an enhanced large vision model for materials characterization
10.1016/j.commatsci.2026.114651 · doi-reference
Image quality assessment: from error visibility to structural similarity
10.1109/tip.2003.819861 · doi-reference
10.1007/978-3-031-72661-3_9
10.1007/978-3-031-72661-3_9 · doi-reference
Towards easy and reliable AFM tip shape determination using blind tip reconstruction
10.1016/j.ultramic.2013.06.022 · doi-reference
Reconstruction algorithms in undersampled AFM imaging
10.1109/jstsp.2015.2500363 · doi-reference
End-to-end differentiable blind tip reconstruction for noisy atomic force microscopy images
10.1038/s41598-022-27057-2 · doi-reference
A fast image reconstruction method based on Bayesian compressed sensing for the undersampled AFM data with noise
10.1088/1361-6501/aaf4e7 · doi-reference
An image inpainting technique based on the fast marching method
10.1080/10867651.2004.10487596 · doi-reference
Piecewise quadratic approximations on triangles
10.1145/355759.355761 · doi-reference
PatchMatch: a randomized correspondence algorithm for structural image editing
10.1145/1531326.1531330 · doi-reference
Biharmonic spline interpolation of GEOS‐3 and SEASAT altimeter data
10.1029/gl014i002p00139 · doi-reference
Neural image enhancement and restoration for time-lapse SPM images
10.35848/1347-4065/ac8537 · doi-reference
Machine learning-driven automated scanning probe microscopy for ferroelectrics
10.1017/s1431927622010972 · doi-reference
10.1002/smll.202503921
10.1002/smll.202503921 · doi-reference
Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints
10.1063/1.1475352 · doi-reference
Large-area high-speed scanning probe microscopy using legacy scanners
10.1063/1.5092704 · doi-reference
Tip artifacts in atomic force microscope imaging of thin film surfaces
10.1063/1.354498 · doi-reference
AFM image artifacts
10.1016/j.apsusc.2014.01.149 · doi-reference
Recent advances in the application of scanning probe microscopy in interfacial electroanalytical chemistry
10.1016/j.jelechem.2023.117443 · doi-reference
Probing of local multifield coupling phenomena of advanced materials by scanning probe microscopy techniques
10.1002/adma.201803064 · doi-reference
Imaging modes of atomic force microscopy for application in molecular and cell biology
10.1038/nnano.2017.45 · doi-reference
A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences
10.1016/j.mechatronics.2004.04.005 · doi-reference