Abstract
Abstract
Authors
Institutions
No ROR-resolved institution is linked to this work yet.
Provenance
crossref
Confidence 100%
unpaywall
Confidence 95%
datacite
Confidence 0%
Tunneling through Thin Oxides—New Insights from Microscopic Calculations
2002 · 0 citations
The Use of Quantum Potentials for Confinement and Tunnelling in Semiconductor Devices
2002 · 0 citations
Study of Electron Transport in SOI MOSFETs Using Monte Carlo Technique with Full-Band Modeling
2002 · 0 citations
No local citing links have been materialized yet.
10.1147/rd.462.0213
10.1147/rd.462.0213 · 2002
10.1147/rd.462.0133
10.1147/rd.462.0133 · 2002
10.1143/jjap.36.7512
10.1143/jjap.36.7512 · 1997
Unresolved referenced work
1985
Unresolved referenced work
Kept as external metadata until matched
Unresolved referenced work
Kept as external metadata until matched
Unresolved referenced work
2003
10.1016/s0375-9601(01)00344-9
10.1016/s0375-9601(01)00344-9 · 2001
10.1063/1.1533108
10.1063/1.1533108 · 2003
10.1016/s0378-4754(02)00241-0
10.1016/s0378-4754(02)00241-0 · 2003
10.1006/spmi.2000.0920
10.1006/spmi.2000.0920 · 2000
Unresolved referenced work
Kept as external metadata until matched
Unresolved referenced work
Kept as external metadata until matched
10.1016/0038-1101(95)00201-4
10.1016/0038-1101(95)00201-4 · 1996
10.1016/s0038-1101(00)00107-6
10.1016/s0038-1101(00)00107-6 · 2000
10.1023/a:1020700819083
10.1023/a:1020700819083 · 2002
10.1023/a:1022988921236
10.1023/a:1022988921236 · 2002
10.1023/a:1022905508032
10.1023/a:1022905508032 · 2002
No additional external references are available.