Abstract
Three-dimensional ToF-SIMS uncovers oxygen retention in the top Pt electrode and unexpected Pt migration into the oxide. This coupled exchange reshapes filament chemistry and may critically influence memristor reliability.
Shimul Kanti Nath, Sanjoy Kumar Nandi, Sujan Kumar Das, Bin Gong, Nicholas J. Ekins-Daukes, Mahesh P. Suryawanshi, William D. A. Rickard, Songyan Yin, Michael P. Nielsen, Robert G. Elliman
Abstract
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