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Privacy-aware community infrastructureF.K. Dey, P.A. Zhdan
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Rights: UNKNOWN · https://www.elsevier.com/tdm/userlicense/1.0/ · Source: journal-auto-sync:external:CROSSREF_ISSN
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On liquid-film thickness measurements with the atomic force microscope
10.1063/1.461420 · 1991
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1994
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