Abstract
Yaqi Lian, Feng He
Abstract
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10.1177/14727978241313261 · doi-reference
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10.1109/icces48766.2020.9137992 · doi-reference
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10.3991/ijet.v18i01.37127 · doi-reference
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10.1109/access.2024.3381032 · doi-reference
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10.1016/j.caeai.2022.100068 · doi-reference
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10.1109/msp.2021.3055032 · doi-reference
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10.1177/14727978251315731 · doi-reference
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10.1201/9781003559092-115 · doi-reference
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10.1109/access.2020.3040338 · doi-reference
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10.3390/electronics13132629 · doi-reference
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10.1109/access.2023.3329576 · doi-reference
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10.1145/3511886 · doi-reference
10.59277/rrst-ee.2023.68.2.16
10.59277/rrst-ee.2023.68.2.16 · doi-reference
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10.1109/jsac.2023.3235443 · doi-reference
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