Abstract
Analysis of nanomaterials is challenging in modeling and in experiments. Due to many difficulties in measuring their properties and a large scatter in results, there is a necessity to use computational methods to obtain better data. Thin film is applied in this paper to model the nanoindentation test and finally to predict the force-depth curve. The nanoindentation test with round tip indenter is simulated and remeshing problem is solved in the program. Numerical graph representing force versus depth, which is an output from the program, is performed to optimize deformation process. Sensitivity analysis is a numerical method used here, which is set in the present work to determine parameters in the deformation process in nanoindentation test and to specify the influence of elastic material model on the test results.