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Privacy-aware community infrastructureJiang Wu, Pengfei Cui, Menghang Dang, Penghui Shang
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Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications
10.1049/hve2.70020 · 2025
Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods
10.1088/1361-6463/ad5c6f · 2024
Dynamic charging behavior of dielectric surfaces induced by electron beam irradiation and its effect on multipacting
2025
Numerical investigation of vacuum surface flashover triggered by inverted potential gradient on solar cells using particle-in-cell method
10.1063/5.0288856 · 2025
Analysis of charging effect on spacecraft surface under solar wind
2022
Database of secondary electron yield and energy spectra for dielectric sam⁃ ples by electron irradiation
2021
Detailed Study of the total electron emission yield (TEEY) properties of black kapton under electron impact
2025
Vacuum recovery of polyimide films damaged with high energy electron radiation
10.1007/s40295-022-00336-w · 2022
Fulfilling the promise of the materials genome initiative with high-throughput experimental methodologies
Confidence 100%
ror
Confidence 99%
openalex
Confidence 95%
datacite
Confidence 0%
10.1063/1.4977487 · 2017
Secondary electron emission from gold microparticles in a transmission electron microscope: comparison of Monte Carlo simulations with experimental results
10.1088/1361-6463/ad9840 · 2024
Modelling the impact of graphene coating of different thicknesses on polyimide substrate on the secondary electron yield
10.3390/coatings14010013 · 2023
Impacts of Geant4 hadronic physics models on secondary particle productions in proton therapy simulations
10.1016/j.radphyschem.2024.112451 · 2025
Surface modification of space exposed materials induced by low energetic proton irradiation
10.1007/s40295-021-00277-w · 2021
10.1016/j.nimb.2022.05.006
10.1016/j.nimb.2022.05.006
Experimental erosion analysis and computational modeling of SiO -coated polyimide in atomic oxygen under super-low-Earth-orbit conditions
10.1016/j.ast.2025.110611 · 2025
Suppression of secondary electron emission from polyimide materials with parallel and crossed groove structures
10.1016/j.vacuum.2025.114342 · 2025
Effect of rectangular grooves and checkerboard patterns on the electron emission yield
10.1063/1.5028216 · 2018
Analytical model of the secondary electron yield of metal regular rough surfaces
10.7498/aps.64.207901 · 2015
DIRECT DETECTION OF DARK MATTER
10.1146/annurev.nucl.54.070103.181244 · 2004
Validation of the Geant4 PIXE component for incident carbon ions
10.1016/j.nimb.2022.10.010 · 2022
Allowing for crystalline structure effects in Geant4
10.1016/j.nimb.2017.03.092 · 2017
Simulation of Auger electron emission from nanometer-size gold targets using the Geant4 Monte Carlo simulation toolkit
10.1016/j.nimb.2016.02.005 · 2016
Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si
10.1063/1.4984761 · 2017
Geant4 physics processes for microdosimetry simulation: very low energy electromagnetic models for electrons in silicon
10.1016/j.nimb.2012.07.028 · 2012
Geant4 physics processes for microdosimetry and secondary electron emission simulation: extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)
10.1016/j.nimb.2020.11.016 · 2021
The study of electron emission from aluminum in the very low primary energy range using Monte Carlo simulations
10.1088/0022-3727/46/12/125306 · 2013
Electron inelastic mean free paths in condensed matter down to a few electronvolts
10.1021/acs.jpcc.8b10832 · 2019
ELSEPA—Dirac partial-wave calculation of elastic scattering of electrons and positrons by atoms, positive ions and molecules
10.1016/j.cpc.2004.09.006 · 2005
Electron inelastic mean free paths for LiF, CaF2, Al2O3, and liquid water from 433 keV down to the energy gap
10.1021/acsomega.9b03872 · 2020
Calculation of energy-loss straggling of C, Al, Si, and Cu for fast H, He, and Li ions
10.1103/physreva.75.022903 · 2007
Effects of electron incident angle on the secondary electron yield for polyimide
2015
Atomic oxygen erosion of a poly(ester-imide) film
10.1016/j.polymdegradstab.2024.111137 · 2025
Probabilistic model for the simulation of secondary electron emission
10.1103/physrevstab.5.124404 · 2002
Unresolved referenced work
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Secondary electron emission in the scanning electron microscope
10.1063/1.332840 · 1983
Secondary electron emission in the scanning electron microscope
10.1063/1.332840 · doi-reference
Probabilistic model for the simulation of secondary electron emission
10.1103/physrevstab.5.124404 · doi-reference
Calculation of energy-loss straggling of C, Al, Si, and Cu for fast H, He, and Li ions
10.1103/physreva.75.022903 · doi-reference
Electron inelastic mean free paths for LiF, CaF2, Al2O3, and liquid water from 433 keV down to the energy gap
10.1021/acsomega.9b03872 · doi-reference
ELSEPA—Dirac partial-wave calculation of elastic scattering of electrons and positrons by atoms, positive ions and molecules
10.1016/j.cpc.2004.09.006 · doi-reference
Electron inelastic mean free paths in condensed matter down to a few electronvolts
10.1021/acs.jpcc.8b10832 · doi-reference
The study of electron emission from aluminum in the very low primary energy range using Monte Carlo simulations
10.1088/0022-3727/46/12/125306 · doi-reference
Geant4 physics processes for microdosimetry and secondary electron emission simulation: extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)
10.1016/j.nimb.2020.11.016 · doi-reference
Geant4 physics processes for microdosimetry simulation: very low energy electromagnetic models for electrons in silicon
10.1016/j.nimb.2012.07.028 · doi-reference
Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si
10.1063/1.4984761 · doi-reference
Simulation of Auger electron emission from nanometer-size gold targets using the Geant4 Monte Carlo simulation toolkit
10.1016/j.nimb.2016.02.005 · doi-reference
Allowing for crystalline structure effects in Geant4
10.1016/j.nimb.2017.03.092 · doi-reference
Validation of the Geant4 PIXE component for incident carbon ions
10.1016/j.nimb.2022.10.010 · doi-reference
DIRECT DETECTION OF DARK MATTER
10.1146/annurev.nucl.54.070103.181244 · doi-reference
Analytical model of the secondary electron yield of metal regular rough surfaces
10.7498/aps.64.207901 · doi-reference
Effect of rectangular grooves and checkerboard patterns on the electron emission yield
10.1063/1.5028216 · doi-reference
Suppression of secondary electron emission from polyimide materials with parallel and crossed groove structures
10.1016/j.vacuum.2025.114342 · doi-reference
Experimental erosion analysis and computational modeling of SiO -coated polyimide in atomic oxygen under super-low-Earth-orbit conditions
10.1016/j.ast.2025.110611 · doi-reference
10.1016/j.nimb.2022.05.006
10.1016/j.nimb.2022.05.006 · doi-reference
Surface modification of space exposed materials induced by low energetic proton irradiation
10.1007/s40295-021-00277-w · doi-reference
Impacts of Geant4 hadronic physics models on secondary particle productions in proton therapy simulations
10.1016/j.radphyschem.2024.112451 · doi-reference
Modelling the impact of graphene coating of different thicknesses on polyimide substrate on the secondary electron yield
10.3390/coatings14010013 · doi-reference
Secondary electron emission from gold microparticles in a transmission electron microscope: comparison of Monte Carlo simulations with experimental results
10.1088/1361-6463/ad9840 · doi-reference
Fulfilling the promise of the materials genome initiative with high-throughput experimental methodologies
10.1063/1.4977487 · doi-reference
Vacuum recovery of polyimide films damaged with high energy electron radiation
10.1007/s40295-022-00336-w · doi-reference
Numerical investigation of vacuum surface flashover triggered by inverted potential gradient on solar cells using particle-in-cell method
10.1063/5.0288856 · doi-reference
Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods
10.1088/1361-6463/ad5c6f · doi-reference
Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications
10.1049/hve2.70020 · doi-reference
Atomic oxygen erosion of a poly(ester-imide) film
10.1016/j.polymdegradstab.2024.111137 · doi-reference